Model
JSM-7800F
Manufacturer
JEOL Ltd, Japan
Purchase Date
2018
Specifications
Resolution: 0.8 nm (15 kV), 1.2 nm (1 kV), Secondary electron image, Backscattered electron image, Acceleration voltage: 0.01 kV-30 kV, Probe current: pA-200nA, Magnification: ×25-×1000000