Field Emission Scanning Electron Microscope(JSM-7800F)

Model

JSM-7800F

Manufacturer

JEOL Ltd, Japan

Purchase Date

2018

Specifications

Resolution: 0.8 nm (15 kV), 1.2 nm (1 kV), Secondary electron image, Backscattered electron image, Acceleration voltage: 0.01 kV-30 kV, Probe current: pA-200nA, Magnification: ×25-×1000000

JSM-7800F

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